Stress Enhanced Local Electrical Characteristic Testing, set up development – SELECT

Strain engineering has evolved significantly in the last decade, enhancing device performance by modulating strain to optimise specific functional properties. Although primarily used in semiconductor manufacturing, this approach shows potential across a variety of materials, such as polymers, metals, and 2D materials. Advancing knowledge in this field, however, necessitates a precise understanding of the link between mechanical and functional behaviours. Existing strain application methods are diverse, but controlling the effect of the applied deformation on the properties of interest still traditionally relies on post-mortem analysis techniques that often require costly and time-consuming integration of external devices. Although some systems have emerged on SEM and TEM to capture in-situ images during straining, challenges persist—especially for near field microscopes, where tracking surface areas and maintaining stability are difficult. The proposal aims to bridge these gaps by developing an innovative straining device fully integrated with a commercial AFM operating under diverse environmental conditions. Validated through studies on PVDF-based materials, this device will enable and automate in situ real-time monitoring of mechanical and electrical properties of materials, thus demonstrating its potential for both fundamental and applied research. Ultimately, this project aspires to deliver a market-ready, user-friendly solution for standard laboratory settings, advancing routine research and education applications.