Xrays Non invasive modification of integrated circuits – MITIX

In order to evaluate the security level of the components used in smart cards or passports while always staying ahead of hackers, engineers and researchers are constantly researching new attack techniques. Recently, CESTI-LETI researchers have explored a new approach to perturb electronic circuits with a nano-focused X-ray beam at the synchrotron. They have shown that it is possible to erase the information contained in a single memory cell such as a Flash of technology 350nm or SRAM of technology 45nm. The objective of this project is to demonstrate the relevance of X-ray integrated circuit attacks on more advanced technologies either using synchrotron radiation or with more accessible means of attack such as laboratory X-ray sources (ITSEF, LSOSP and SIMAP). The simulation and modelling of the mechanisms implemented (at TIMA and ONERA) will allow in this project the development of appropriate software and hardware countermeasures that will be tested experimentally. These new methods of attack may one day be able to be part of the Common Criteria certification scheme for components used in the field of cybersecurity.