CE42 - Capteurs, instrumentation

Nano-fabricated probes for next generation Photonic Force Microscopy – HiRes-PFM

Submission summary

Photonic Force Microscopy (PFM) is a scanning probe imaging technique based on optical tweezers. As in Atomic Force Microscopy (AFM), a probe raster scans the sample and provides details of its topography at the nanometer level. Instead of the rigid cantilever used in AFM, PFM employs the focused laser beam of optical tweezers to manipulate the probe. This has the potential advantage to apply a much lower force on the sample (a fraction of pN), and therefore to avoid artifacts and damages encountered when scanning soft materials like living cells. In our project, we aim to bring PFM closer to applications. Using specific nanofabricated probes, we will increase the resolution of the technique, and proposing both technical ameliorations and completely novel modalities, we aim to make PMF a mature, versatile, and wide spread technique.

Project coordination

Francesco PEDACI (Centre de biochimie structurale)

The author of this summary is the project coordinator, who is responsible for the content of this summary. The ANR declines any responsibility as for its contents.


CBS Centre de biochimie structurale
IES Institut d'Electronique et des Systèmes
CNR / Istituto per i Processi Chimico-Fisici

Help of the ANR 375,972 euros
Beginning and duration of the scientific project: March 2021 - 42 Months

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