Référence projet : 11-EQPX-0010
RST : Gilles RENAUD
Etablissement Coordinateur : CEA Saclay
Région du projet : Auvergne-Rhône-Alpes
Discipline : 2 - SMI
Aide de l'ANR 2 000 000 euros
Investissement couvrant la période de juin 2012 à décembre 2019
Two of the 5 French CRG synchrotron beamlines at ESRF, IF and D2AM, are dedicated to structural characterization for materials science, nanosciences and nanotechnologies. The CRG/F Equipex project allowed to upgrade two of their main instruments, to address the novel needs of their wide French and European communities of users, offering performances at the best international level in the domain of in situ and operando time-resolved studies. Two main challenges have been addressed:
1. The in situ and time-resolved study of nano-objects during their growth or operando reactions, through the coupling of wide and small angle X-ray scattering measurements on IF. A unique fast and heavy duty diffractometer coupled with a UHV-deposition reactor have been designed and realized, and a 2D pixel detector of the latest generation has been purchased. These allow e.g. investigating growth processes 10 to 100 times faster than previously possible, reaching timescales in the few second range, at which e.g. the nucleation of semiconductor quantum dots and nanowires happens. The use of 2D detectors provides more structural/morphological information at once. This equipment is now fully operational and the results of the first experimental campaigns will soon be published.
2. The complete structural characterization of nanostructures and operando characterization of materials (batteries, nanostructured PV cells, light-emitting diodes, membranes, thin films, catalytic particles ...) by simultaneous wide/small-angle scattering and/or by anomalous measurements on the D2AM beamline. A new customized 2D pixel detector has been purchased and is now in operational. It allows faster acquisition, so as to follow reactions down to the millisecond scale and/or to measure simultaneously a wide range of reciprocal space as a function of time and X-ray incoming beam energy. Microfocusing of the X-ray beam will provide higher spatial resolution.
L'auteur de ce résumé est le coordinateur du projet, qui est responsable du contenu de ce résumé. L'ANR décline par conséquent toute responsabilité quant à son contenu.